Thin film measurement is a critical area of research in materials science and engineering, focusing on the characterization of films that are only a few nanometers to micrometers thick.

When using CCI for thick-film measurement the optics are moved vertically so that the upper and lower film surfaces pass through the focus. For each pixel a set of interference fringes are ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Filmetrics® F40 benchtop thin-film ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Optical NanoGauge Thickness ...